Invention Grant
- Patent Title: System for testing an embedded wireless transceiver
- Patent Title (中): 用于测试嵌入式无线收发器的系统
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Application No.: US11839814Application Date: 2007-08-16
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Publication No.: US08131223B2Publication Date: 2012-03-06
- Inventor: Christian Volf Olgaard
- Applicant: Christian Volf Olgaard
- Applicant Address: US CA Sunnyvale
- Assignee: Litepoint Corporation
- Current Assignee: Litepoint Corporation
- Current Assignee Address: US CA Sunnyvale
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
A test equipment for testing a wireless communication device includes a wireless transceiver, memory, and a controller. The wireless transceiver transmits a first and second series of packets. The wireless transceiver receives a power level indicator that is based on at least one of the first series of packets. The memory stores the power level indicator. The controller performs a signal strength test. More specifically, the controller controls the transceiver to transmit the first series of packets at a first power level. The controller stores the power level indicator in memory when the power level indicator is received by the transceiver. The controller controls the transceiver to transmit the second series of packets at a second power level.
Public/Granted literature
- US20080293363A1 System for Testing an Embedded Wireless Transceiver Public/Granted day:2008-11-27
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