Invention Grant
- Patent Title: Sensor apparatus
- Patent Title (中): 传感器装置
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Application No.: US12693583Application Date: 2010-01-26
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Publication No.: US08131507B2Publication Date: 2012-03-06
- Inventor: Takeshi Uemura
- Applicant: Takeshi Uemura
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Pearne & Gordon LLP
- Priority: JP2009-024664 20090205
- Main IPC: G06F11/30
- IPC: G06F11/30

Abstract:
A sensor apparatus of the present invention is provided with a failure diagnosis circuit for setting as a failure diagnosis object section at least any one of a drive circuit section, a detection device, a detection circuit section and a processing circuit section, determining whether the failure diagnosis object section is normal or abnormal, and outputting a failure detection signal from a second output terminal in the case of determining abnormality. It is configured such that a signal of a value outside a range of a normal output voltage is outputted from the first output terminal in the case of the failure diagnosis circuit determining abnormality of the failure diagnosis object section, thereby to improve reliability under abnormal condition.
Public/Granted literature
- US20100198557A1 SENSOR APPARATUS Public/Granted day:2010-08-05
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