Invention Grant
- Patent Title: Method and apparatus for warranty cost calculation
- Patent Title (中): 保修成本计算方法和装置
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Application No.: US10954678Application Date: 2004-09-30
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Publication No.: US08131653B2Publication Date: 2012-03-06
- Inventor: Ying-Che Chien , Niren Cc Choudhury , Paul Hampton Franklin , Shirish N. Kher , Holly-Dee Rubin , Paul A. Remick , Philip L. Scarff , Hongzhou Wang
- Applicant: Ying-Che Chien , Niren Cc Choudhury , Paul Hampton Franklin , Shirish N. Kher , Holly-Dee Rubin , Paul A. Remick , Philip L. Scarff , Hongzhou Wang
- Applicant Address: FR Paris
- Assignee: Alcatel Lucent
- Current Assignee: Alcatel Lucent
- Current Assignee Address: FR Paris
- Agency: Wall & Tong, LLP
- Main IPC: G06Q99/00
- IPC: G06Q99/00

Abstract:
Method and apparatus for calculating warranty cost includes determining values for a plurality of parameters that characterize a corresponding plurality of physical conditions of a product that is returned under warranty, determining values for a plurality of variables that characterize a customer profile for the product and evaluating an expression that calculates warranty cost based on said determined parameter and variable values. The plurality of physical conditions of the product includes the conditions of no-trouble-found (NTF), repaired, junked, and subject to further failure mode analysis (FMA). The plurality of parameters further comprises probabilities and costs that correspond to each of the physical conditions. Evaluating the above expression includes evaluating a first expression that calculates repair, product conformance and Dead-On-Arrival cost and evaluating a second expression that calculates Change Notice cost. Subsequently, the two costs are summed to arrive at the total warranty cost.
Public/Granted literature
- US20060069581A1 Method and apparatus for warranty cost calculation Public/Granted day:2006-03-30
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