Invention Grant
- Patent Title: Dynamic functional testing coverage based on failure dependency graph
- Patent Title (中): 基于故障依赖图的动态功能测试覆盖
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Application No.: US12039190Application Date: 2008-02-28
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Publication No.: US08132056B2Publication Date: 2012-03-06
- Inventor: Rajesh P. Thakkar , John Kurian
- Applicant: Rajesh P. Thakkar , John Kurian
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Daniel McIoughlin
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A method, system and computer program product is disclosed for providing test coverage for detecting failures in a software application. The method comprises the steps of identifying a set of test cases; and for each of at least a subset of said test cases, identifying one or more of the other test cases that depend on said each of the test cases based on a defined functional relationship. The method comprises the further steps of using a selected one of said subset of test cases to test the software application; and when said test of the software application fails, then testing the software application with the one or more of the other test cases that depend on said selected one of the test cases based on said functional relationship.
Public/Granted literature
- US20090222697A1 DYNAMIC FUNCTIONAL TESTING COVERAGE BASED ON FAILURE DEPENDENCY GRAPH Public/Granted day:2009-09-03
Information query
