Invention Grant
- Patent Title: Refrigeration system and refrigeration system analyzer
- Patent Title (中): 制冷系统和制冷系统分析仪
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Application No.: US12225485Application Date: 2007-03-23
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Publication No.: US08132419B2Publication Date: 2012-03-13
- Inventor: Tsuyoshi Yonemori , Yoshinari Sasaki , Takahiro Yamaguchi
- Applicant: Tsuyoshi Yonemori , Yoshinari Sasaki , Takahiro Yamaguchi
- Applicant Address: JP Osaka
- Assignee: Daikin Industries, Ltd.
- Current Assignee: Daikin Industries, Ltd.
- Current Assignee Address: JP Osaka
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2006-080687 20060323; JP2007-040803 20070221
- International Application: PCT/JP2007/056032 WO 20070323
- International Announcement: WO2007/108537 WO 20070927
- Main IPC: F25B49/02
- IPC: F25B49/02

Abstract:
In a refrigeration system (10) that includes a refrigerant circuit (20) configured by connecting a plurality of circuit component parts including a compressor (30), a pressure reduction device (36, 39) and a plurality of heat exchangers (34, 37) and operates in a refrigeration cycle by circulating refrigerant through the refrigerant circuit (20), a refrigerant state detection section (51) is provided for detecting the refrigerant temperatures and entropies at the entrance and exit of each of the compressor (30), the pressure reduction device (36, 39) and the heat exchangers (34, 37), and a variation calculation section (52) is provided that uses the refrigerant temperatures and entropies detected by the refrigerant state detection section (51) to separately calculate the magnitude of energy variation of refrigerant produced in each of the circuit component parts.
Public/Granted literature
- US20090151377A1 Refrigeration System and Refrigeration System Analyzer Public/Granted day:2009-06-18
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