Invention Grant
- Patent Title: Apparatus and method for monitoring wear of components
- Patent Title (中): 用于监测部件磨损的装置和方法
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Application No.: US12194876Application Date: 2008-09-15
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Publication No.: US08132467B2Publication Date: 2012-03-13
- Inventor: Sachin R. Shinde , Anand A. Kulkarni , David J. Mitchell
- Applicant: Sachin R. Shinde , Anand A. Kulkarni , David J. Mitchell
- Applicant Address: US FL Orlando
- Assignee: Siemens Energy, Inc.
- Current Assignee: Siemens Energy, Inc.
- Current Assignee Address: US FL Orlando
- Main IPC: G01L1/00
- IPC: G01L1/00

Abstract:
A structure and method for instrumenting a component for monitoring wear in a coating. The method includes depositing a first thin layer of electrically insulating material, depositing a thin electrically conductive layer over the first electrically insulating layer, depositing a second thin layer of electrically insulating material over the electrically conductive layer. An overlying thickness of the coating material is deposited over the second thin layer of electrically insulating material. The thicknesses of the insulating and conducting layers is controlled to be small enough such that the overlying coating surface exposed to mechanical wear retains a desired degree of smoothness without the necessity for a separate planarization step.
Public/Granted literature
- US20100068508A1 APPARATUS AND METHOD FOR MONITORING WEAR OF COMPONENTS Public/Granted day:2010-03-18
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