Invention Grant
US08133806B1 Systems and methods for forming semiconductor materials by atomic layer deposition
有权
通过原子层沉积形成半导体材料的系统和方法
- Patent Title: Systems and methods for forming semiconductor materials by atomic layer deposition
- Patent Title (中): 通过原子层沉积形成半导体材料的系统和方法
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Application No.: US12895311Application Date: 2010-09-30
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Publication No.: US08133806B1Publication Date: 2012-03-13
- Inventor: Christiaan J. Werkhoven
- Applicant: Christiaan J. Werkhoven
- Applicant Address: FR Bernin
- Assignee: S.O.I.Tec Silicon on Insulator Technologies
- Current Assignee: S.O.I.Tec Silicon on Insulator Technologies
- Current Assignee Address: FR Bernin
- Agency: TraskBritt
- Main IPC: H01L21/28
- IPC: H01L21/28

Abstract:
Methods of depositing a III-V semiconductor material on a substrate include sequentially introducing a gaseous precursor of a group III element and a gaseous precursor of a group V element to the substrate by altering spatial positioning of the substrate with respect to a plurality of gas columns. For example, the substrate may be moved relative to a plurality of substantially aligned gas columns, each disposing a different precursor. Thermalizing gas injectors for generating the precursors may include an inlet, a thermalizing conduit, a liquid container configured to hold a liquid reagent therein, and an outlet. Deposition systems for forming one or more III-V semiconductor materials on a surface of the substrate may include one or more such thermalizing gas injectors configured to direct the precursor to the substrate via the plurality of gas columns.
Public/Granted literature
- US20120083101A1 SYSTEMS AND METHODS FOR FORMING SEMICONDUCTOR MATERIALS BY ATOMIC LAYER DEPOSITION Public/Granted day:2012-04-05
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