Invention Grant
US08133823B2 Method for picking up semiconductor chips from a wafer table and method for mounting semiconductor chips on a substrate
有权
从晶片台拾取半导体芯片的方法以及将半导体芯片安装在基板上的方法
- Patent Title: Method for picking up semiconductor chips from a wafer table and method for mounting semiconductor chips on a substrate
- Patent Title (中): 从晶片台拾取半导体芯片的方法以及将半导体芯片安装在基板上的方法
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Application No.: US12247986Application Date: 2008-10-08
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Publication No.: US08133823B2Publication Date: 2012-03-13
- Inventor: Stefan Behler , Patrick Blessing
- Applicant: Stefan Behler , Patrick Blessing
- Applicant Address: CH Cham
- Assignee: Oerlikon Assembly Equipment AG, Steinhausen
- Current Assignee: Oerlikon Assembly Equipment AG, Steinhausen
- Current Assignee Address: CH Cham
- Agency: Nixon Peabody LLP
- Priority: CH1562/07 20071009; CH1136/08 20080717
- Main IPC: H01L21/98
- IPC: H01L21/98

Abstract:
The invention relates to a method for picking up semiconductor chips from a wafer table and, optionally, their mounting on a substrate by means of a pick-and-place system. The position and orientation of the semiconductor chip to be mounted next are determined by means of a first camera and made available in the form of positional data relating to a first system of coordinates. The position and orientation of the substrate place on which the semiconductor chip will be mounted are determined by means of a second camera and made available in the form of positional data relating to a second system of coordinates. The conversion of coordinates of the first or second system of coordinates into coordinates of motion of the pick-and-place system occurs by means of two fixed mapping functions and two changeable correction vectors. The correction vectors are readjusted on the occurrence of a predetermined event.
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