Invention Grant
US08134131B2 Method and apparatus for observing inside structures, and specimen holder
有权
用于观察内部结构和试样架的方法和装置
- Patent Title: Method and apparatus for observing inside structures, and specimen holder
- Patent Title (中): 用于观察内部结构和试样架的方法和装置
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Application No.: US12329661Application Date: 2008-12-08
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Publication No.: US08134131B2Publication Date: 2012-03-13
- Inventor: Shohei Terada , Kazutoshi Kaji , Shigeto Isakozawa
- Applicant: Shohei Terada , Kazutoshi Kaji , Shigeto Isakozawa
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Dickstein Shapiro LLP
- Priority: JP2003-325910 20030918
- Main IPC: G21K5/00
- IPC: G21K5/00

Abstract:
An object of the invention is to provide a method and apparatus for observing inside structures and a specimen holder, wherein aging degradation of a good sample to a bad sample can be tracked in the same field of view, using the same specimen in order to determine the mechanism of failure. The present invention is a method for observing inside structures. The method comprises irradiating a specimen with a corpuscular beam generated from a corpuscular beam source, detecting transmitted particles transmitted by the specimen, applying a voltage to a portion of the specimen, and observing of a detection status of the transmitted particles in the voltage-applied portion as needed.
Public/Granted literature
- US20090302234A1 Method and Apparatus for Observing Inside Structures, and Specimen Holder Public/Granted day:2009-12-10
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