Invention Grant
- Patent Title: Group-III nitride semiconductor device
- Patent Title (中): III族氮化物半导体器件
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Application No.: US10575625Application Date: 2004-10-13
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Publication No.: US08134168B2Publication Date: 2012-03-13
- Inventor: Hiromitsu Sakai , Mineo Okuyama
- Applicant: Hiromitsu Sakai , Mineo Okuyama
- Applicant Address: JP Tokyo
- Assignee: Showa Denko K.K.
- Current Assignee: Showa Denko K.K.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2003-354237 20031014
- International Application: PCT/JP2004/015456 WO 20041013
- International Announcement: WO2005/036658 WO 20050421
- Main IPC: H01L33/00
- IPC: H01L33/00 ; H01L31/0328 ; H01L31/072

Abstract:
An object of the present invention is to provide a Group III nitride semiconductor element which comprises a thick AlGaN layer exhibiting high crystallinity and containing no cracks, and which does not include a thick GaN layer (which generally serves as a light-absorbing layer in an ultraviolet LED).The inventive Group III nitride semiconductor element comprises a substrate; a first nitride semiconductor layer composed of AlN which is provided on the substrate; a second nitride semiconductor layer composed of Alx1Ga1-x1N (0≦x1≦0.1) which is provided on the first nitride semiconductor layer; and a third nitride semiconductor layer composed of Alx2Ga1-x2N (0
Public/Granted literature
- US20070126009A1 Group-III nitride semiconductor device Public/Granted day:2007-06-07
Information query
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