Invention Grant
- Patent Title: Multi-electrode measuring system
- Patent Title (中): 多电极测量系统
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Application No.: US12777942Application Date: 2010-05-11
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Publication No.: US08134357B2Publication Date: 2012-03-13
- Inventor: Jung-Chuan Chou , Wei-Chuan Chen , Cheng-Wei Chen , Chien-Cheng Chen
- Applicant: Jung-Chuan Chou , Wei-Chuan Chen , Cheng-Wei Chen , Chien-Cheng Chen
- Applicant Address: TW Yunlin
- Assignee: National Yunlin University of Science and Technology
- Current Assignee: National Yunlin University of Science and Technology
- Current Assignee Address: TW Yunlin
- Priority: TW98138785A 20091116
- Main IPC: G01R13/00
- IPC: G01R13/00

Abstract:
The invention provides a multi-electrode measuring system including a front end device which is a sensing device including a multi-electrode sensing device having a plurality of electrodes; a multi-channel fixture coupled to the multi-electrode sensing device; and a reference electrode. A back-end device as a virtual instrumentation is an electronic device including a read out circuit device coupled to the multi-channel fixture and the reference electrode for receiving each original signal from each electrode of the multi-electrode sensing device and the reference electrode determining a sample solution; a data acquisition device coupled to the read out circuit device for digitizing each original signal to form a digital signal and for array sampling; and a signal processing device coupled to the data acquisition device for processing each signal.
Public/Granted literature
- US20110115473A1 MULTI-ELECTRODE MEASURING SYSTEM Public/Granted day:2011-05-19
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