Invention Grant
- Patent Title: Detecting quench in a magnetic resonance examination system
- Patent Title (中): 在磁共振检测系统中检测淬火
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Application No.: US12513188Application Date: 2007-11-05
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Publication No.: US08134368B2Publication Date: 2012-03-13
- Inventor: Holger Timinger , Johannes Adrianus Overweg
- Applicant: Holger Timinger , Johannes Adrianus Overweg
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP06123803 20061110
- International Application: PCT/IB2007/054479 WO 20071105
- International Announcement: WO2008/056314 WO 20080515
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
The present invention relates to a magnetic resonance examination system (10) and to a method of operating such a magnetic resonance examination system (10). In particular the present invention relates to a magnetic resonance examination system (10) comprising a superconducting main magnet (20) surrounding an examination region (18) and generating a main magnetic field in the examination region (18), and further comprising a magnetic field gradient system (30) selectively causing alternating gradient magnetic fields in the examination region (18), said magnetic field gradient system (30) being coupled to the main magnet (20). In order to provide a technique to reliably detect a quench of the superconducting main magnet (20) of such a magnetic resonance examination system (10) a detecting device (91) is suggested for detecting an emerging quench of the main magnet (20), said detecting device (91) being adapted to operate in different modes depending on the mode of operation of the magnetic resonance examination system (e.g. ramp-up, ramp-down or continuous operation).
Public/Granted literature
- US20100056378A1 DETECTING QUENCH IN A MAGNETIC RESONANCE EXAMINATION SYSTEM Public/Granted day:2010-03-04
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