Invention Grant
- Patent Title: Evaluation circuit for capacitance and method thereof
- Patent Title (中): 电容评估电路及其方法
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Application No.: US12494477Application Date: 2009-06-30
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Publication No.: US08134374B2Publication Date: 2012-03-13
- Inventor: Yu Kuang
- Applicant: Yu Kuang
- Applicant Address: TW Hsinchu County
- Assignee: Raydium Semiconductor Corporation
- Current Assignee: Raydium Semiconductor Corporation
- Current Assignee Address: TW Hsinchu County
- Priority: TW97127517A 20080718
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
In an evaluation method, voltages at ends of a to-be-measured capacitor and a capacitance-adjustable circuit are switched in response to a first set of clock signals so as to adjust an integrated voltage to be a sum of the integrated voltage and a first difference voltage. Next, whether a first control event is received is judged. If not, the previous step is performed. If yes, an integration operation is performed to switch a voltage of an end of a known capacitor in order to adjust the integrated voltage to be a sum of the integrated voltage and a second difference voltage. Next, whether an integrating period ends is judged. If not, the first step is repeated. If yes, a capacitance of the to-be-measured capacitor is obtained according to the number of times that the integration operation is performed in the integrating period and a capacitance of the known capacitor.
Public/Granted literature
- US20100013502A1 EVALUATION CIRCUIT FOR CAPACITANCE AND METHOD THEREOF Public/Granted day:2010-01-21
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