Invention Grant
- Patent Title: DAC calibration
- Patent Title (中): DAC校准
-
Application No.: US12795225Application Date: 2010-06-07
-
Publication No.: US08134486B2Publication Date: 2012-03-13
- Inventor: Fang-Shi Jordan Lai , Yung-Fu Lin , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng
- Applicant: Fang-Shi Jordan Lai , Yung-Fu Lin , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman Ham & Berner, LLP
- Main IPC: H03M1/10
- IPC: H03M1/10
Abstract:
Mechanisms to calibrate a digital to analog converter (DAC) of an SDM (sigma delta modulator) are disclosed. An extra DAC element in addition to the DAC is used to function in place of a DAC element under calibration. A signal (e.g., a random sequence of −1 and +1) is injected to the DAC element under calibration, and the estimated error and compensation are acquired.
Public/Granted literature
- US20110037631A1 DAC CALIBRATION Public/Granted day:2011-02-17
Information query
