Invention Grant
US08134615B2 Image defect correction apparatus, image defect correction method, and program therefor
有权
图像缺陷校正装置,图像缺陷校正方法及其程序
- Patent Title: Image defect correction apparatus, image defect correction method, and program therefor
- Patent Title (中): 图像缺陷校正装置,图像缺陷校正方法及其程序
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Application No.: US11868410Application Date: 2007-10-05
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Publication No.: US08134615B2Publication Date: 2012-03-13
- Inventor: Hideyuki Rengakuji
- Applicant: Hideyuki Rengakuji
- Applicant Address: JP
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2006-288925 20061024
- Main IPC: H04N9/64
- IPC: H04N9/64

Abstract:
An image defect correction apparatus capable of satisfactorily correcting a white vertical line caused by point defects on the same vertical CCD. A first correction value is determined from a difference between an average value of luminance signals obtained by a vertical CCD including one or more point defects and an average value of luminance signals obtained by the vertical CCDs when light-receiving elements face a predetermined ineffective signal region. It is determined to which of regions divided by Y addresses of point defects on the same vertical CCD each of Y-directional positions of luminance signals outputted from a horizontal CCD is positioned. The first correction value is multiplied by a predetermined coefficient corresponding to the determined region to calculate a second correction value with which the luminance signals from the horizontal CCD are corrected.
Public/Granted literature
- US20080094492A1 IMAGE DEFECT CORRECTION APPARATUS, IMAGE DEFECT CORRECTION METHOD, AND PROGRAM THEREFOR Public/Granted day:2008-04-24
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