Invention Grant
- Patent Title: Method and device for specific absorption rate measurement of an electric field
- Patent Title (中): 用于电场的比吸收率测量的方法和装置
-
Application No.: US12447289Application Date: 2006-10-27
-
Publication No.: US08135549B2Publication Date: 2012-03-13
- Inventor: Jonas Friden , Martin Siegbahn
- Applicant: Jonas Friden , Martin Siegbahn
- Applicant Address: SE Stockholm
- Assignee: Telefonaktiebolaget L M Ericsson (Publ)
- Current Assignee: Telefonaktiebolaget L M Ericsson (Publ)
- Current Assignee Address: SE Stockholm
- Agent Roger S. Burleigh
- International Application: PCT/SE2006/050429 WO 20061027
- International Announcement: WO2008/051125 WO 20080502
- Main IPC: G01R29/08
- IPC: G01R29/08

Abstract:
A method and device for calculating the Specific Absorption Rate (SAR) caused in a body by the electric field of a wireless communications device. The method involves using a model of a body, wherein the device is placed in proximity to the model and the electric field is measured at discrete points, including measuring the magnitude of the electric field at points of a first and a second surface of the model. By means of the measured magnitudes, the phase at said points is determined, such that the complex electric field at said points is determined. The complex electric field at said points is then used to determine the complex electric field in the model of the body. The complex electric field is used in order to calculate the SAR value caused by the device.
Public/Granted literature
- US20100004881A1 Method and device for specific absorption rate measurement of an electric field Public/Granted day:2010-01-07
Information query