According to an example embodiment, an apparatus may include logic. The apparatus may be configured to: determine, based on an error location polynomial, an error location syndrome corresponding to an actual location of a burst error in a data block; select a burst error pattern that is less than or equal to M bits, and having no more than Y consecutive zeros within the burst error, where M is greater than the order of the error location polynomial; determine an error pattern syndrome based on the selected burst error pattern and the error location polynomial; and determine an actual location of the burst error in the data block based on the error location syndrome and the error pattern syndrome.