Invention Grant
- Patent Title: Rotating body dynamic quantity measuring device and system
- Patent Title (中): 旋转体动力测量装置及系统
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Application No.: US12761970Application Date: 2010-04-16
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Publication No.: US08146443B2Publication Date: 2012-04-03
- Inventor: Hiroyuki Ohta , Takashi Sumigawa
- Applicant: Hiroyuki Ohta , Takashi Sumigawa
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2005-035376 20050214
- Main IPC: G01L1/22
- IPC: G01L1/22

Abstract:
A single crystal semiconductor including a Wheatstone bridge circuit formed of an impurity diffusion layer whose longitudinal direction is aligned with a particular crystal orientation is connected to a rotating body. A rotating body dynamic quantity measuring device and a system using the measuring device are fatigue- and corrosion-resistant because of the single crystal semiconductor used and are not easily affected by temperature variations because of the bridge circuit considering a single crystal anisotropy.
Public/Granted literature
- US20100192697A1 ROTATING BODY DYNAMIC QUANTITY MEASURING DEVICE AND SYSTEM Public/Granted day:2010-08-05
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