A semiconductor radiation detector device, comprising a bulk layer (103) of semiconductor material, and on the first surface of the bulk layer (303) in the following order: a modified internal gate layer (104) of semiconductor material of second conductivity type, a barrier layer (305) of semiconductor material of first conductivity type and pixel dopings (131, 132, 133) of semiconductor material of the second conductivity type, adapted to be coupled to at least one pixel voltage in order to create pixels corresponding to pixel dopings, characterized in that the device comprises a first contact of first conductivity type and said pixel voltage is defined as the potential difference between the pixel doping and the first contact.