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US08148787B2 Semiconductor device and method for manufacturing the same 失效
半导体装置及其制造方法

Semiconductor device and method for manufacturing the same
Abstract:
There is disclosed a semiconductor device comprising a P-channel MIS transistor which includes an N-type semiconductor layer, a first gate insulating layer formed on the N-type semiconductor layer and containing a carbon compound of a metal, and an N-channel MIS transistor which includes a P-type semiconductor layer, a second gate insulating layer formed on the P-type semiconductor layer, and a second gate electrode formed on the second gate insulating layer.
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