Invention Grant
US08149155B2 Range measuring method, range measuring apparatus, non-contacted IC medium and range measuring system
有权
范围测量方法,量程测量仪器,非接触式IC介质和量程测量系统
- Patent Title: Range measuring method, range measuring apparatus, non-contacted IC medium and range measuring system
- Patent Title (中): 范围测量方法,量程测量仪器,非接触式IC介质和量程测量系统
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Application No.: US12338538Application Date: 2008-12-18
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Publication No.: US08149155B2Publication Date: 2012-04-03
- Inventor: Takehiro Kawai
- Applicant: Takehiro Kawai
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Dickstein Shapiro LLP
- Priority: JPP.2007-325887 20071218
- Main IPC: G01S13/00
- IPC: G01S13/00

Abstract:
A method of measuring a range from a reader unit to a non-contacted IC medium, includes: transmitting an inquiry signal at a first frequency from the reader unit to the non-contacted IC medium; causing the non-contacted IC medium to perform modulation to modulate the first frequency by using a second frequency to obtain a modulated frequency, and causing the non-contacted IC medium to respond to a response signal at the modulated frequency; causing the reader unit to receive the response signal to acquire a plurality of frequency components; calculating a phase difference between signals of at least two of the acquired plurality of frequency components; and measuring the range by using the phase difference.
Public/Granted literature
- US20090195438A1 RANGE MEASURING METHOD, RANGE MEASURING APPARATUS, NON-CONTACTED IC MEDIUM AND RANGE MEASURING SYSTEM Public/Granted day:2009-08-06
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