Invention Grant
US08149155B2 Range measuring method, range measuring apparatus, non-contacted IC medium and range measuring system 有权
范围测量方法,量程测量仪器,非接触式IC介质和量程测量系统

  • Patent Title: Range measuring method, range measuring apparatus, non-contacted IC medium and range measuring system
  • Patent Title (中): 范围测量方法,量程测量仪器,非接触式IC介质和量程测量系统
  • Application No.: US12338538
    Application Date: 2008-12-18
  • Publication No.: US08149155B2
    Publication Date: 2012-04-03
  • Inventor: Takehiro Kawai
  • Applicant: Takehiro Kawai
  • Applicant Address: JP Kyoto
  • Assignee: Omron Corporation
  • Current Assignee: Omron Corporation
  • Current Assignee Address: JP Kyoto
  • Agency: Dickstein Shapiro LLP
  • Priority: JPP.2007-325887 20071218
  • Main IPC: G01S13/00
  • IPC: G01S13/00
Range measuring method, range measuring apparatus, non-contacted IC medium and range measuring system
Abstract:
A method of measuring a range from a reader unit to a non-contacted IC medium, includes: transmitting an inquiry signal at a first frequency from the reader unit to the non-contacted IC medium; causing the non-contacted IC medium to perform modulation to modulate the first frequency by using a second frequency to obtain a modulated frequency, and causing the non-contacted IC medium to respond to a response signal at the modulated frequency; causing the reader unit to receive the response signal to acquire a plurality of frequency components; calculating a phase difference between signals of at least two of the acquired plurality of frequency components; and measuring the range by using the phase difference.
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