Invention Grant
- Patent Title: Test data processing apparatus and test data processing method
- Patent Title (中): 测试数据处理设备和测试数据处理方法
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Application No.: US11870110Application Date: 2007-10-10
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Publication No.: US08149376B2Publication Date: 2012-04-03
- Inventor: Hiromichi Ohashi
- Applicant: Hiromichi Ohashi
- Applicant Address: JP Ibaraki-shi, Osaka
- Assignee: Nitto Denko Corporation
- Current Assignee: Nitto Denko Corporation
- Current Assignee Address: JP Ibaraki-shi, Osaka
- Priority: JP2006-277922 20061011; JP2007-183470 20070712
- Main IPC: G02F1/13
- IPC: G02F1/13

Abstract:
The test data processing apparatus of the present invention is a test data processing apparatus for processing test data obtained by testing defects of a sheet-shaped product having at least an optical film which is a member of an optical displaying apparatus, comprising a defect information preparing section, wherein, on the basis of surface defect test data relating to a surface defect and bright point test data relating to a bright point obtained when the optical film or a laminate body containing the optical film is regarded as an object of testing, in a case that a position of the surface defect and a position of the bright point are identical, the surface defect and the bright point located at the identical position are not regarded as a defect for processing by the defect information preparing section.
Public/Granted literature
- US20080088790A1 TEST DATA PROCESSING APPARATUS AND TEST DATA PROCESSING METHOD Public/Granted day:2008-04-17
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