Invention Grant
US08149376B2 Test data processing apparatus and test data processing method 有权
测试数据处理设备和测试数据处理方法

  • Patent Title: Test data processing apparatus and test data processing method
  • Patent Title (中): 测试数据处理设备和测试数据处理方法
  • Application No.: US11870110
    Application Date: 2007-10-10
  • Publication No.: US08149376B2
    Publication Date: 2012-04-03
  • Inventor: Hiromichi Ohashi
  • Applicant: Hiromichi Ohashi
  • Applicant Address: JP Ibaraki-shi, Osaka
  • Assignee: Nitto Denko Corporation
  • Current Assignee: Nitto Denko Corporation
  • Current Assignee Address: JP Ibaraki-shi, Osaka
  • Priority: JP2006-277922 20061011; JP2007-183470 20070712
  • Main IPC: G02F1/13
  • IPC: G02F1/13
Test data processing apparatus and test data processing method
Abstract:
The test data processing apparatus of the present invention is a test data processing apparatus for processing test data obtained by testing defects of a sheet-shaped product having at least an optical film which is a member of an optical displaying apparatus, comprising a defect information preparing section, wherein, on the basis of surface defect test data relating to a surface defect and bright point test data relating to a bright point obtained when the optical film or a laminate body containing the optical film is regarded as an object of testing, in a case that a position of the surface defect and a position of the bright point are identical, the surface defect and the bright point located at the identical position are not regarded as a defect for processing by the defect information preparing section.
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