Invention Grant
- Patent Title: Resistance variable memory device
- Patent Title (中): 电阻变量存储器件
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Application No.: US12629671Application Date: 2009-12-02
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Publication No.: US08149613B2Publication Date: 2012-04-03
- Inventor: Minoru Ikarashi , Yutaka Higo , Masanori Hosomi , Hiroshi Kano , Shinichiro Kusunoki , Hiroyuki Ohmori , Yuki Oishi , Tetsuya Yamamoto , Kazutaka Yamane
- Applicant: Minoru Ikarashi , Yutaka Higo , Masanori Hosomi , Hiroshi Kano , Shinichiro Kusunoki , Hiroyuki Ohmori , Yuki Oishi , Tetsuya Yamamoto , Kazutaka Yamane
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2008-309024 20081203
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/14 ; G11C11/15

Abstract:
A resistance variable memory device is provided and includes a resistance variable memory cell that writes data by utilizing a spin transfer effect based on an injection current. The memory device also includes a driving circuit that generates a combined pulse of a plurality of write pulses and an offset pulse defining the level between the write pulses and supplies the combined pulse to the memory cell at the time of the writing.
Public/Granted literature
- US20100135069A1 RESISTANCE VARIABLE MEMORY DEVICE Public/Granted day:2010-06-03
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