Invention Grant
US08149619B2 Memory structure having volatile and non-volatile memory portions
有权
具有易失性和非易失性存储器部分的存储器结构
- Patent Title: Memory structure having volatile and non-volatile memory portions
- Patent Title (中): 具有易失性和非易失性存储器部分的存储器结构
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Application No.: US13026052Application Date: 2011-02-11
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Publication No.: US08149619B2Publication Date: 2012-04-03
- Inventor: Howard C. Kirsch , Charles Ingalls , Werner Juengling
- Applicant: Howard C. Kirsch , Charles Ingalls , Werner Juengling
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder
- Main IPC: G11C14/00
- IPC: G11C14/00

Abstract:
A memory array is provided that includes a transistor having two active gates sharing a source, a drain, and a channel of the transistor. One of the active gates may be coupled to a volatile memory portion of a memory cell, such as a DRAM cell, and the other active gate may be coupled to a non-volatile memory portion, for example, a charge storage node such as a SONOS cell. Methods of operating the memory array are provided that include transferring data from the volatile memory portions to the non-volatile memory portions, transferring data from the non-volatile memory portions to the volatile memory portions, and erasing the non-volatile memory portions of a row of memory cells.
Public/Granted literature
- US20110127596A1 MEMORY STRUCTURE HAVING VOLATILE AND NON-VOLATILE MEMORY PORTIONS Public/Granted day:2011-06-02
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