Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12569776Application Date: 2009-09-29
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Publication No.: US08149721B2Publication Date: 2012-04-03
- Inventor: Shinichi Ishikawa , Hajime Sugimura , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant: Shinichi Ishikawa , Hajime Sugimura , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: H04J1/16
- IPC: H04J1/16

Abstract:
There is provided a test apparatus for testing a device under test, including an obtaining section that obtains a packet sequence communicated between the test apparatus and the device under test, from a simulation environment for simulating an operation of the device under test, a packet communication program generating section that generates from the packet sequence a packet communication program for a test, where the packet communication program is to be executed by the test apparatus to communicate packets included in the packet sequence between the test apparatus and the device under test, and a testing section that executes the packet communication program to test the device under test by communicating the packets between the test apparatus and the device under test.
Public/Granted literature
- US20100142391A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2010-06-10
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