Invention Grant
- Patent Title: Inspection using three-dimensional profile information
- Patent Title (中): 检查使用三维轮廓信息
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Application No.: US12470510Application Date: 2009-05-22
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Publication No.: US08150105B2Publication Date: 2012-04-03
- Inventor: Zahid F. Mian , Robert W. Foss
- Applicant: Zahid F. Mian , Robert W. Foss
- Applicant Address: US NY Troy
- Assignee: International Electronic Machines Corporation
- Current Assignee: International Electronic Machines Corporation
- Current Assignee Address: US NY Troy
- Agency: Hoffman Warnick LLC
- Agent John W. LaBatt
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A three-dimensional profile of at least a portion of an object, such as a vehicle, is generated using image data corresponding to the object. The image data can be acquired as the object passes an inspection location and can be enhanced using emitted electromagnetic radiation or the like. The three-dimensional profile is analyzed to identify any anomalies that are associated with the object. The analysis can include comparing the three-dimensional profile to a standard three-dimensional profile corresponding to a type of the object. Further, the analysis can include comparing the three-dimensional profile to a previously acquired three-dimensional profile for the object. The three-dimensional profile can be generated using visible light-based image data, and one or more additional profiles based on non-visible data also can be generated and analyzed.
Public/Granted literature
- US20090290757A1 INSPECTION USING THREE-DIMENSIONAL PROFILE INFORMATION Public/Granted day:2009-11-26
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