Invention Grant
US08150315B2 Method for verifying the alignment between integrated electronic devices
有权
用于验证集成电子设备之间的对准的方法
- Patent Title: Method for verifying the alignment between integrated electronic devices
- Patent Title (中): 用于验证集成电子设备之间的对准的方法
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Application No.: US12826571Application Date: 2010-06-29
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Publication No.: US08150315B2Publication Date: 2012-04-03
- Inventor: Roberto Canegallo , Mauro Scandiuzzo , Eleonora Franchi Scarselli , Antonio Gnudi , Roberto Guerrieri
- Applicant: Roberto Canegallo , Mauro Scandiuzzo , Eleonora Franchi Scarselli , Antonio Gnudi , Roberto Guerrieri
- Applicant Address: IT Agrate Brianza
- Assignee: STMicroelectronics S.r.l.
- Current Assignee: STMicroelectronics S.r.l.
- Current Assignee Address: IT Agrate Brianza
- Agency: Seed IP Law Group PLLC
- Main IPC: H04B5/00
- IPC: H04B5/00

Abstract:
A method for verifying alignment between first and second integrated devices coupled together using a reference and a coupling capacitor, including: transmitting a reference signal on a transmission electrode of the reference capacitor; receiving a coupling signal on a reception electrode of the reference capacitor; amplifying the coupling signal, generating a reception reference signal; generating a reception control signal as a function of the reception reference signal; transmitting a communication signal on an electrode of the coupling capacitor; receiving a reception signal on an electrode of the coupling capacitor; amplifying the reception signal, generating a first compensated signal; controlling a level of amplification of amplifying the coupling signal and the reception signal as a function of the reception control signal; and detecting a possible misalignment between the first and second devices based on an amplitude of the communication signal and an amplitude of the compensated signal.
Public/Granted literature
- US20110319015A1 METHOD FOR VERIFYING THE ALIGNMENT BETWEEN INTEGRATED ELECTRONIC DEVICES Public/Granted day:2011-12-29
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