Invention Grant
- Patent Title: Automatic analzyer
- Patent Title (中): 自动分析仪
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Application No.: US12362818Application Date: 2009-01-30
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Publication No.: US08150645B2Publication Date: 2012-04-03
- Inventor: Kumiko Kamihara , Tomonori Mimura , Shinichi Fukuzono
- Applicant: Kumiko Kamihara , Tomonori Mimura , Shinichi Fukuzono
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, P.C.
- Priority: JP2008-020039 20080131
- Main IPC: G06F17/18
- IPC: G06F17/18

Abstract:
Measurement of the uncertainty used for quality control typically involves a plurality of factors. When the uncertainty exceeds a clinical permissible value, time is required for a medical technologist to investigate and to determine the factor causing the uncertainty. It is thus beneficial to automatically investigate factors in complicated uncertainty, particularly from the view point of reagents and samples which are subject to quality change and that are prone to affect the measurement quality. Quality control samples having a plurality of concentration levels are measured to calculate the average, coefficient of variation, standard deviation, and other numerical values. When quality control samples having n (n≧2) different concentration levels are measured, variation patterns determine the factor causing the uncertainty, the factor being specific to each of 3n different combinations of variation patterns.
Public/Granted literature
- US20090198463A1 AUTOMATIC ANALZYER Public/Granted day:2009-08-06
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