Invention Grant
- Patent Title: Automated testing platform for event driven systems
- Patent Title (中): 事件驱动系统的自动测试平台
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Application No.: US12476954Application Date: 2009-06-02
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Publication No.: US08150674B2Publication Date: 2012-04-03
- Inventor: Rajan Anand , Paritosh Bajpay
- Applicant: Rajan Anand , Paritosh Bajpay
- Applicant Address: US GA Atlanta
- Assignee: AT&T Intellectual Property I, LP
- Current Assignee: AT&T Intellectual Property I, LP
- Current Assignee Address: US GA Atlanta
- Agency: Parks IP Law LLC
- Agent Jennifer P. Medlln, Esq.
- Main IPC: G06F9/45
- IPC: G06F9/45 ; G06F9/455

Abstract:
A platform for the automated testing of event driven software applications is provided. A source environment is replicated to a target environment. The target environment includes a target system. A test case is defined with a target system, specific attributes and verification information. The attributes of the test case include the target system. The test case is fired. An event is simulated for the test case based on the target system and the specific attributes. The simulated event is transmitted to the target environment. The results of the test case being fired are determined based on verification information. The results are recorded to a data store.
Public/Granted literature
- US20100306590A1 Automated Testing Platform for Event Driven Systems Public/Granted day:2010-12-02
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