Invention Grant
- Patent Title: Dynamically estimating lifetime of a semiconductor device
- Patent Title (中): 动态估计半导体器件的寿命
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Application No.: US12086357Application Date: 2005-12-30
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Publication No.: US08151094B2Publication Date: 2012-04-03
- Inventor: Xavier Vera , Jaume Abella , Osman Unsal , Oguz Ergin , Antonio González
- Applicant: Xavier Vera , Jaume Abella , Osman Unsal , Oguz Ergin , Antonio González
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Trop, Pruner & Hu, P.C.
- International Application: PCT/ES2005/070188 WO 20051230
- International Announcement: WO2007/077264 WO 20070712
- Main IPC: G06F11/30
- IPC: G06F11/30
Abstract:
The present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner.
Public/Granted literature
- US20090287909A1 Dynamically Estimating Lifetime of a Semiconductor Device Public/Granted day:2009-11-19
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