Invention Grant
- Patent Title: Tap time division multiplexing with scan test
- Patent Title (中): 抽头时分复用与扫描测试
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Application No.: US12657228Application Date: 2010-01-15
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Publication No.: US08151151B2Publication Date: 2012-04-03
- Inventor: Robert Warren
- Applicant: Robert Warren
- Applicant Address: GB Bristol
- Assignee: STMicroelectronics Limited
- Current Assignee: STMicroelectronics Limited
- Current Assignee Address: GB Bristol
- Priority: EP03257952 20031217
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/02 ; G11C29/00
Abstract:
An integrated circuit comprising (i) a plurality of portions, each portion including test control circuitry; and (ii) at least one test input arranged to receive test signals, the circuit having a test mode in which one or more of the plurality of portions are testable, wherein the circuit has a reset mode which has priority over the test mode.
Public/Granted literature
- US20100192031A1 Tap time division multiplexing with scan test Public/Granted day:2010-07-29
Information query
