Invention Grant
- Patent Title: Automatic defect management in memory devices
- Patent Title (中): 内存设备自动缺陷管理
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Application No.: US11995812Application Date: 2007-12-03
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Publication No.: US08151163B2Publication Date: 2012-04-03
- Inventor: Ofir Shalvi , Dotan Sokolov
- Applicant: Ofir Shalvi , Dotan Sokolov
- Applicant Address: IL Herzliya
- Assignee: Anobit Technologies Ltd.
- Current Assignee: Anobit Technologies Ltd.
- Current Assignee Address: IL Herzliya
- Agency: D. Kligler IP Services Ltd.
- International Application: PCT/IL2007/001488 WO 20071203
- International Announcement: WO2008/068747 WO 20080612
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
A method for storing data in a memory (28) that includes analog memory cells (32) includes identifying one or more defective memory cells in a group of the analog memory cells. An Error Correction Code (ECC) is selected responsively to a characteristic of the identified defective memory cells. The data is encoded using the selected ECC and the encoded data is stored in the group of the analog memory cells. In an alternative method, an identification of one or more defective memory cells among the analog memory cells is generated. Analog values are read from the analog memory cells in which the encoded data were stored, including at least one of the defective memory cells. The analog values are processed using an ECC decoding process responsively to the identification of the at least one of the defective memory cells, so as to reconstruct the data.
Public/Granted literature
- US20100115376A1 AUTOMATIC DEFECT MANAGEMENT IN MEMORY DEVICES Public/Granted day:2010-05-06
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