Invention Grant
- Patent Title: Analysis device
- Patent Title (中): 分析装置
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Application No.: US11498900Application Date: 2006-08-04
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Publication No.: US08151190B2Publication Date: 2012-04-03
- Inventor: Miki Taki , Yoshimitsu Takagi
- Applicant: Miki Taki , Yoshimitsu Takagi
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2005-227771 20050805
- Main IPC: G06F15/00
- IPC: G06F15/00

Abstract:
An analysis device allowing any person to utilize job guidance for setting and assignment operations with high efficiency regardless of a level of skill in an automatic analysis device which has a complicated screen configuration with an increase of functions. A storage unit stores a job guidance file and a correspondence list file indicating correspondences between procedure IDs, codes, buttons, etc. in the job guidance file and screen IDs for device control program software. When an operator selects the procedure ID or the like in a displayed job guidance window, control is performed such that the screen ID corresponding to the selected procedure ID or the like is searched for in the correspondence list file, and the displayed screen is shifted to one corresponding to the searched screen ID for the device control program software.
Public/Granted literature
- US20070038411A1 Analysis device Public/Granted day:2007-02-15
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