Invention Grant
- Patent Title: e-Profiler: dynamic profiling and auditing framework
- Patent Title (中): e-Profiler:动态剖析和审计框架
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Application No.: US11755773Application Date: 2007-05-31
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Publication No.: US08151251B2Publication Date: 2012-04-03
- Inventor: Akhilesh Laddha , Ritwik Batabyal
- Applicant: Akhilesh Laddha , Ritwik Batabyal
- Applicant Address: IN Bangalore, Karnataka
- Assignee: Wipro Limited
- Current Assignee: Wipro Limited
- Current Assignee Address: IN Bangalore, Karnataka
- Agency: Global IP Services, PLLC
- Agent Prakash Nama
- Main IPC: G06F9/45
- IPC: G06F9/45

Abstract:
A method of dynamically generating profiling data using runtime non-intrusive profiling of application transactions which are contained in containers such as web servers, application servers, portal servers and J2EE/ECM containers, includes the following steps: using common resources of memory and environment for both profiling activity and application transactions; remotely executing project specific profiling administration and configuration; using the executed project specific profiling administration and configuration and completing remote profiling, and generating profiling data by taking assistance selectively from Aspect Oriented Programming, and Application Response Measurement; and, selectively using the profiling data to analyze performance bottlenecks and do auditing as needed by a user. The profiling is done by capturing metrics based on accepted standards, partially using the same memory as for the application transactions, without code-contamination in the containers and can be done layer-wise, tier-wise or at method level. A computer readable medium encoded with the method is included.
Public/Granted literature
- US20080301170A1 e-PROFILER: DYNAMIC PROFILING AND AUDITING FRAMEWORK Public/Granted day:2008-12-04
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