Invention Grant
- Patent Title: Multi-mode probe tweezer
- Patent Title (中): 多模探头镊子
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Application No.: US12586261Application Date: 2009-09-18
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Publication No.: US08152213B2Publication Date: 2012-04-10
- Inventor: William S. Fortune
- Applicant: William S. Fortune
- Agent Leon D. Rosen
- Main IPC: B25B7/00
- IPC: B25B7/00

Abstract:
A tweezer that is especially useful for testing and repair of electronic circuits includes a pair of resilient blades (14, 16) with rear ends (22) fixed at a mount (24) to a pair of dielectric plastic mounting blocks (110, 112) that are clamped together by a clamping tube (140) that can be slid on and off. Front portions of the blades are connected to a spacing adjuster (80) that includes a thumb wheel (86) that can be turned to adjust the separation of the front ends (20) of the blades. The tweezer can be used as a regular tweezer, and the blades can be used as independent electrical probes.
Public/Granted literature
- US20110068594A1 Multi-mode probe tweezer Public/Granted day:2011-03-24
Information query
IPC分类: