Invention Grant
US08153500B2 Method of fabricating an epitaxially grown layer on a composite structure 有权
在复合结构上制造外延生长层的方法

  • Patent Title: Method of fabricating an epitaxially grown layer on a composite structure
  • Patent Title (中): 在复合结构上制造外延生长层的方法
  • Application No.: US12663696
    Application Date: 2009-01-06
  • Publication No.: US08153500B2
    Publication Date: 2012-04-10
  • Inventor: Bruce FaureAlexandra Marcovecchio
  • Applicant: Bruce FaureAlexandra Marcovecchio
  • Applicant Address: FR Bernin
  • Assignee: Soitec
  • Current Assignee: Soitec
  • Current Assignee Address: FR Bernin
  • Agency: Winston & Strawn LLP
  • Priority: FR0850362 20080121
  • International Application: PCT/EP2009/050086 WO 20090106
  • International Announcement: WO2009/092624 WO 20090730
  • Main IPC: H01L21/76
  • IPC: H01L21/76
Method of fabricating an epitaxially grown layer on a composite structure
Abstract:
A method of fabricating materials by epitaxy by epitaxially growing at least one layer of a material upon a composite structure that has at least one thin film bonded to a support substrate and a bonding layer of oxide formed by deposition between the support substrate and the thin film. The thin film and the support substrate have a mean thermal expansion coefficient of 7×10−6 K−1 or more. The bonding layer is formed by low pressure chemical vapor deposition (LPCVD) of a layer of silicon oxide on the bonding face of the support substrate or on the bonding face of the thin film. The thin film has a thickness of 5 micrometers or less while the thickness of the layer of oxide is equal to or greater than the thickness of the thin film. The method also includes a heat treatment carried out at a temperature that is higher than the temperature for deposition of the layer of oxide of silicon and for a predetermined period.
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