Invention Grant
- Patent Title: Electromagnetic wave detecting element
- Patent Title (中): 电磁波检测元件
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Application No.: US12409535Application Date: 2009-03-24
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Publication No.: US08154100B2Publication Date: 2012-04-10
- Inventor: Yoshihiro Okada
- Applicant: Yoshihiro Okada
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: SOLARIS Intellectual Property Group, PLLC
- Priority: JP2008-093856 20080331
- Main IPC: H01L31/00
- IPC: H01L31/00

Abstract:
The present invention is to provide an electromagnetic wave detecting element that can suppress the trapping of charges in a semiconductor layer. Plural lower electrodes, which collect charges generated in the semiconductor layer, are each provided to cover at least a portion in a length direction and the entire region in a width direction of a scan line adjacent thereto, and the lower electrodes are disposed at positions at which the scan lines are provided.
Public/Granted literature
- US20090244343A1 ELECTROMAGNETIC WAVE DETECTING ELEMENT Public/Granted day:2009-10-01
Information query
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