Invention Grant
- Patent Title: Voltage measuring device and voltage measuring system
- Patent Title (中): 电压测量装置和电压测量系统
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Application No.: US12071881Application Date: 2008-02-27
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Publication No.: US08154300B2Publication Date: 2012-04-10
- Inventor: Manabu Ooishi , Satoshi Ishikawa
- Applicant: Manabu Ooishi , Satoshi Ishikawa
- Applicant Address: JP Tokyo
- Assignee: Yazaki Corporation
- Current Assignee: Yazaki Corporation
- Current Assignee Address: JP Tokyo
- Agency: Edwards Wildman Palmer LLP
- Priority: JP2007-050150 20070228
- Main IPC: H01M8/04
- IPC: H01M8/04
Abstract:
In a voltage measuring device, according to a setting of input terminals for setting the number of unit cells to be measured SEL1, SEL2, SEL3, a logic circuit turns on switches in a switching circuit connected to the unit cells to measure a voltage across each unit cell.
Public/Granted literature
- US20080203976A1 Voltage measuring device and voltage measuring system Public/Granted day:2008-08-28
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