Invention Grant
US08154316B2 Method and apparatus for indexing an adjustable test probe tip 有权
用于对可调节的测试头尖进行索引的方法和装置

Method and apparatus for indexing an adjustable test probe tip
Abstract:
Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.
Public/Granted literature
Information query
Patent Agency Ranking
0/0