Invention Grant
US08154316B2 Method and apparatus for indexing an adjustable test probe tip
有权
用于对可调节的测试头尖进行索引的方法和装置
- Patent Title: Method and apparatus for indexing an adjustable test probe tip
- Patent Title (中): 用于对可调节的测试头尖进行索引的方法和装置
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Application No.: US12333096Application Date: 2008-12-11
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Publication No.: US08154316B2Publication Date: 2012-04-10
- Inventor: Chris W. Lagerberg , Roger Stark
- Applicant: Chris W. Lagerberg , Roger Stark
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01R31/20
- IPC: G01R31/20

Abstract:
Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.
Public/Granted literature
- US20100148759A1 METHOD AND APPARATUS FOR INDEXING AN ADJUSTABLE TEST PROBE TIP Public/Granted day:2010-06-17
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