Invention Grant
US08154908B2 Nonvolatile semiconductor storage device and data writing method therefor
有权
非易失性半导体存储器件及其数据写入方法
- Patent Title: Nonvolatile semiconductor storage device and data writing method therefor
- Patent Title (中): 非易失性半导体存储器件及其数据写入方法
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Application No.: US13024926Application Date: 2011-02-10
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Publication No.: US08154908B2Publication Date: 2012-04-10
- Inventor: Hiroshi Maejima , Katsuaki Isobe , Hideo Mukai
- Applicant: Hiroshi Maejima , Katsuaki Isobe , Hideo Mukai
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-032646 20080214
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A nonvolatile semiconductor storage device includes: a first wire and a second wire intersecting each other; a memory cell which is disposed at each intersection of the first wire and the second wire and electrically rewritable and in which a variable resistor for memorizing a resistance value as data in a nonvolatile manner and a rectifying device are connected in series; and a control circuit which applies a voltage necessary for writing of data to the first and second wires. The control circuit precharges a non-selected second wire up to a standby voltage larger than a reference voltage prior to a set operation for programming only a variable resistor connected to selected first and second wires by supplying the reference voltage to a non-selected first wire and the selected second wire, applying a program voltage necessary for programming of the selected variable resistor based on the reference voltage to the selected first wire and applying a control voltage which prevents the rectifying device from turning ON based on the program voltage to the non-selected second wire.
Public/Granted literature
- US20110128775A1 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND DATA WRITING METHOD THEREFOR Public/Granted day:2011-06-02
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