Invention Grant
- Patent Title: Hardware and method to test phase linearity of phase synthesizer
- Patent Title (中): 测试相位合成器相位线性的硬件和方法
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Application No.: US12531830Application Date: 2008-03-14
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Publication No.: US08155174B2Publication Date: 2012-04-10
- Inventor: Jaeha Kim , Hae-Chang Lee , Thomas H. Greer, III
- Applicant: Jaeha Kim , Hae-Chang Lee , Thomas H. Greer, III
- Applicant Address: US CA Sunnyvale
- Assignee: Rambus Inc.
- Current Assignee: Rambus Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Morgan, Lewis & Bockius LLP
- International Application: PCT/US2008/056952 WO 20080314
- International Announcement: WO2008/118659 WO 20081002
- Main IPC: H04B3/46
- IPC: H04B3/46

Abstract:
A circuit to test phase linearity of a phase synthesizer, which synthesizes an output clock having a phase corresponding to a digital phase value input to the phase synthesizer. A digital counter provides the digital phase value to the phase synthesizer. The digital counter receives a counter clock synchronized with an input clock. The digital phase value is stepped by the digital counter, thereby shifting the frequency of the output clock. The output clock is analyzed with respect to phase linearity of the phase synthesizer to produce a phase linearity analysis output.
Public/Granted literature
- US20100102868A1 Hardware and Method to Test Phase Linearity of Phase Synthesizer Public/Granted day:2010-04-29
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