Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay

Invention Grant

US08155914B2 Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay 有权

Title translation: 基于光子延迟测量射频，微波或毫米信号中的相位噪声

Patent Title: Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay
Patent Title (中): 基于光子延迟测量射频，微波或毫米信号中的相位噪声
Application No.: US12889398

Application Date: 2010-09-23
Publication No.: US08155914B2

Publication Date: 2012-04-10
Inventor: Danny Eliyahu , Lute Maleki , David Seidel
Applicant: Danny Eliyahu , Lute Maleki , David Seidel
Applicant Address: US CA Pasadena
Assignee: OEwaves, Inc.
Current Assignee: OEwaves, Inc.
Current Assignee Address: US CA Pasadena
Agency: Perkins Coie LLP
Main IPC: H04B10/08
IPC: H04B10/08

Abstract:

Techniques and devices for measuring phase noise in radio frequency (RF), microwave, or millimeter signals based on photonic delay.

Abstract(Chinese):

基于光子延迟测量射频（RF），微波或毫米信号中的相位噪声的技术和设备。

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