Invention Grant
- Patent Title: Method for the determination of a nacelle-inclination
- Patent Title (中): 确定机舱倾斜度的方法
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Application No.: US12480068Application Date: 2009-06-08
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Publication No.: US08155920B2Publication Date: 2012-04-10
- Inventor: Per Egedal
- Applicant: Per Egedal
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Priority: EP08010478 20080609
- Main IPC: G01M1/00
- IPC: G01M1/00 ; G06F19/00 ; G06F17/40

Abstract:
In one aspect, a method for the determination of a nacelle-inclination is provided. A first difference-signal is formed from the difference of a measured nacelle acceleration and an offset-value from a calibration. A second difference-signal is formed from a difference of the first difference-signal and a feedback signal. A first sum-signal is formed from adding an integrated second difference-signal with the product of the second difference signal and a factor. A second sum signal is formed from adding an integrated first sum-signal with the product of the first-sum-signal and the factor. A corrected signal is formed by a product of the second sum-signal and an equivalent tower height. A first nacelle-signal is formed by the arc-tangent of the corrected signal. A nacelle inclination is obtained from filtering the first nacelle-signal by a low-pass-filter. The feedback-signal is formed by multiplying the acceleration of gravity with the sine of the first nacelle-signal.
Public/Granted literature
- US20100063769A1 METHOD FOR THE DETERMINATION OF A NACELLE-INCLINATION Public/Granted day:2010-03-11
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