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US08156391B2 Data controlling in the MBIST chain architecture 失效
MBIST链架构中的数据控制

Data controlling in the MBIST chain architecture
Abstract:
A memory collar including a first circuit and a second circuit. The first circuit may be configured to generate one or more data sequences in response to one or more test commands. The one or more data sequences may be presented to a memory during a test mode. The second circuit may be configured to pre-process one or more outputs generated by the memory in response to the one or more data sequences.
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