Invention Grant
- Patent Title: Selectively accessing test access ports in a multiple test access port environment
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Application No.: US13098799Application Date: 2011-05-02
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Publication No.: US08156394B2Publication Date: 2012-04-10
- Inventor: Lee D. Whetsel
- Applicant: Lee D. Whetsel
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A TAP linking module (21, 51) permits plural TAPs (TAPs 1-4) to be controlled and accessed from a test bus (13) via a single TAP interface (20).
Public/Granted literature
- US20110209019A1 SELECTIVELY ACCESSING TEST ACCESS PORTS IN A MULTIPLE TEST ACCESS PORT ENVIRONMENT Public/Granted day:2011-08-25
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