Invention Grant
US08156396B1 Method and system for correcting timing errors in high data rate automated test equipment 有权
用于校正高数据速率自动化测试设备中的定时误差的方法和系统

  • Patent Title: Method and system for correcting timing errors in high data rate automated test equipment
  • Patent Title (中): 用于校正高数据速率自动化测试设备中的定时误差的方法和系统
  • Application No.: US12898621
    Application Date: 2010-10-05
  • Publication No.: US08156396B1
    Publication Date: 2012-04-10
  • Inventor: Jean-Yann GazounaudHoward Maassen
  • Applicant: Jean-Yann GazounaudHoward Maassen
  • Main IPC: G01R31/28
  • IPC: G01R31/28
Method and system for correcting timing errors in high data rate automated test equipment
Abstract:
A system and method for reducing timing errors in automated test equipment (ATE) offering increased data rates for the testing of higher-speed integrated circuits. Embodiments provide an effective mechanism for increasing the data rate of an ATE system by delegating processing tasks to multiple test components, where the resulting data rate of the system may approach the sum of the data rates of the individual components. Each component is able to perform data-dependent timing error correction on data processed by the component, where the timing error may result from data processed by another component in the system. Embodiments enable timing error correction by making the component performing the correction aware of the data (e.g., processed by another component) causing the error. The data may be shared between components using existing timing interfaces, thereby saving the cost associated with the design, verification and manufacturing of new and/or additional hardware.
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