Invention Grant
- Patent Title: Quantitative diagnostic methods using multiple parameters
- Patent Title (中): 定量诊断方法采用多参数
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Application No.: US11850550Application Date: 2007-09-05
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Publication No.: US08158374B1Publication Date: 2012-04-17
- Inventor: Yiwu He , Bo Pi , John Bilello
- Applicant: Yiwu He , Bo Pi , John Bilello
- Applicant Address: US CA San Diego
- Assignee: Ridge Diagnostics, Inc.
- Current Assignee: Ridge Diagnostics, Inc.
- Current Assignee Address: US CA San Diego
- Agency: Fish & Richardson P.C.
- Main IPC: G01N33/53
- IPC: G01N33/53 ; G01N33/537 ; G01N33/567 ; G01N33/566
Abstract:
Materials and Methods related to diagnosing a clinical condition in a subject, or determining the subject's predisposition to develop the clinical condition, using a multi-parameter system to measure a plurality of parameters and an algorithm to determine a disease score.
Information query
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