Invention Grant
- Patent Title: Thermo-compression bonded electrical interconnect structure
- Patent Title (中): 热压接电气互连结构
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Application No.: US12984707Application Date: 2011-01-05
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Publication No.: US08164192B2Publication Date: 2012-04-24
- Inventor: Bruce K. Furman , Jae-Woong Nah
- Applicant: Bruce K. Furman , Jae-Woong Nah
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Schmeiser, Olsen & Watts
- Agent Daniel P. Morris
- Main IPC: H01L25/488
- IPC: H01L25/488

Abstract:
An electrical structure and method for forming. The electrical structure includes a first substrate comprising a first electrically conductive pad, a second substrate comprising a second electrically conductive pad, and an interconnect structure electrically and mechanically connecting the first electrically conductive pad to the second electrically conductive pad. The interconnect structure comprises a non-solder metallic core structure and a first solder structure. The first solder structure electrically and mechanically connects a first portion of the non-solder metallic core structure to the first electrically conductive pad. A second portion of the non-solder metallic core structure is thermo-compression bonded to the second electrically conductive pad.
Public/Granted literature
- US20110095431A1 THERMO-COMPRESSION BONDED ELECTRICAL INTERCONNECT STRUCTURE Public/Granted day:2011-04-28
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