Invention Grant
- Patent Title: Test apparatus
- Patent Title (中): 测试仪器
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Application No.: US12603350Application Date: 2009-10-21
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Publication No.: US08164351B2Publication Date: 2012-04-24
- Inventor: Yoshihiro Hashimoto
- Applicant: Yoshihiro Hashimoto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01R27/08 ; G01R31/26

Abstract:
Provided is a test apparatus that tests a device under test, including a power supply that generates supply power supplied to the device under test, a transmission path that transmits the supply power generated by the power supply to the device under test, an intermediate capacitor that is provided between the transmission path and a ground potential, a power supply current measuring section that measures a current flowing through the transmission path at a position closer to the power supply than the intermediate capacitor, a charge and discharge current measuring section that measures a charge and discharge current of the intermediate capacitor, and a load current calculating section that calculates a load current flowing through the device under test based on a sum of the current measured by the power supply current measuring section and the current measured by the charge and discharge current measuring section.
Public/Granted literature
- US20110018559A1 TEST APPARATUS Public/Granted day:2011-01-27
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