Invention Grant
US08164964B2 Boosting voltage levels applied to an access control line when accessing storage cells in a memory
有权
当访问存储器中的存储单元时,提升施加到访问控制线的电压电平
- Patent Title: Boosting voltage levels applied to an access control line when accessing storage cells in a memory
- Patent Title (中): 当访问存储器中的存储单元时,提升施加到访问控制线的电压电平
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Application No.: US12591751Application Date: 2009-11-30
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Publication No.: US08164964B2Publication Date: 2012-04-24
- Inventor: Vikas Chandra , Cezary Pietrzyk , Robert Campbell Aitken
- Applicant: Vikas Chandra , Cezary Pietrzyk , Robert Campbell Aitken
- Applicant Address: GB Cambridge
- Assignee: ARM Limited
- Current Assignee: ARM Limited
- Current Assignee Address: GB Cambridge
- Agency: Nixon & Vanderhye P.C.
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A semiconductor memory storage device is disclosed, the memory comprises: a plurality of storage cells for storing data; at least two access control lines each for controlling access to a respective at least one of the plurality of storage cells; at least two access control circuits each for controlling a voltage level supplied to a corresponding one of the at least two access control lines in response to an access request, the at least two access control circuits each comprising a capacitor and switching circuitry; routing circuitry for routing the access request and a boost signal to a selected one of the at least two access control circuits in dependence upon an address associated with the access request; wherein the at least two access control circuits are each responsive to: receipt of the access request from the routing circuitry to connect the selected access control line to a supply voltage; and receipt of the boost signal from the routing circuitry to disconnect the supply voltage from the access control line and to couple the boost signal to the access control line through the capacitor of the access control circuit to provide a boost to a voltage level on the access control line.
Public/Granted literature
- US20110063932A1 Boosting voltage levels applied to an access control line when accessing storage cells in a memory Public/Granted day:2011-03-17
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